Zhang Geng-yu,Yang Bao-he,Zhao Jian,Li Cui-ping,Li Ming-ji.Impact of cooling condition on the crystal structure and surface quality of preferred c-axis-oriented AlN films for SAW devices[J].Optoelectronics Letters,2011,7(4):273-276
Impact of cooling condition on the crystal structure and surface quality of preferred c-axis-oriented AlN films for SAW devices
Author NameAffiliation
Zhang Geng-yu Tianjin Key Laboratory of Film Electronic and Communication Devices,Tianjin University of Technology 
Yang Bao-he Tianjin Key Laboratory of Film Electronic and Communication Devices,Tianjin University of Technology 
Zhao Jian Tianjin Key Laboratory of Film Electronic and Communication Devices,Tianjin University of Technology 
Li Cui-ping Tianjin Key Laboratory of Film Electronic and Communication Devices,Tianjin University of Technology 
Li Ming-ji Tianjin Key Laboratory of Film Electronic and Communication Devices,Tianjin University of Technology 
Abstract:
      AlN films with preferred c-axis orientation are deposited on Si substrates using the radio frequency(RF) magnetron sputtering method.The post-processing is carried out under the cooling conditions including high vacuum,low vacuum under deposition gas ambient and low vacuum under dynamic N2 ambient.Structures and morphologies of the films are analyzed by X-ray diffraction(XRD) and atomic force microscopy(AFM).The hardness and Young’s modulus are investigated by the nanoindenter.The experimental r...
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