YANG Ming-yang,ZHOU Jun,L Petti,S De Nicola,P Mormile.Fractal characteristics of far-field diffraction patterns for two-dimensional Thue-Morse quasicrystals[J].Optoelectronics Letters,2011,7(5):346-349
Fractal characteristics of far-field diffraction patterns for two-dimensional Thue-Morse quasicrystals
Author NameAffiliation
YANG Ming-yang Institute of Photonics, Faculty of Science, Ningbo University Istituto di Cibernetica "E. Caianiello" del Consiglio Nazionale delle Ricerche, Via Campi Flegrei 34 
ZHOU Jun Institute of Photonics, Faculty of Science, Ningbo University Istituto di Cibernetica "E. Caianiello" del Consiglio Nazionale delle Ricerche, Via Campi Flegrei 34 
L Petti Istituto Nazionale di Ottica del Consiglio Nazionale delle Ricerche, Via Campi Flegrei 34 
S De Nicola Istituto Nazionale di Ottica del Consiglio Nazionale delle Ricerche, Via Campi Flegrei 34 
P Mormile Istituto Nazionale di Ottica del Consiglio Nazionale delle Ricerche, Via Campi Flegrei 34 
Abstract:
      We report a numerical method to analyze the fractal characteristics of far-field diffraction patterns for two-dimensional Thue-Morse (2-D TM) structures. The far-field diffraction patterns of the 2-D TM structures can be obtained by the numerical method, and they have a good agreement with the experimental ones. The analysis shows that the fractal characteristics of far-field diffraction patterns for the 2-D TM structures are determined by the inflation rule, which have potential applications in...
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