Jian-ping Guo,Jia-hu Zhu,Xu-guang Huang.Index sensing characteristics of the plasmonic sensor based on metal-insulator-metal waveguide-coupled structure[J].Optoelectronics Letters,2013,9(5):321-324
Index sensing characteristics of the plasmonic sensor based on metal-insulator-metal waveguide-coupled structure
Author NameAffiliationE-mail
Jian-ping Guo Laboratory of Nanophotonic Functional Materials and Devices, South China Normal University, Guangzhou, 510006, China

School of Physics and Telecommunication Engineering, South China Normal University, Guangzhou, 510006, China 
guojpgz@163.com 
Jia-hu Zhu Laboratory of Nanophotonic Functional Materials and Devices, South China Normal University, Guangzhou, 510006, China  
Xu-guang Huang Laboratory of Nanophotonic Functional Materials and Devices, South China Normal University, Guangzhou, 510006, China  
Abstract:
      A plasmonic refractive index sensor based on metal-insulator-metal (MIM) waveguide-coupled structure is proposed and demonstrated in this paper. The physical mechanism of the device is deduced, and the finite difference time domain (FDTD) method is employed to simulate and study its index sensing characteristics. Both analytic and simulated results show that the resonant wavelength of the sensor has a linear relationship with the refractive index of material under sensing. Based on the relationship, the refractive index of the material can be obtained from the detection of the resonant wavelength. The results show that the sensitivity of the sensor can exceed 1600 nm/RIU, and it can be used in chemical and biological detections.
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