1. School of Electrical Engineering, Yancheng Institute of Technology, Yancheng 224007, China;2. School of Electrical and Automation Engineering, Changshu Institute of Technology, Changshu 215500, China;3. School of Physics and Electronic Engineering, Northeast Petroleum University, Daqing 163318, China;4. Wuxi Novo Automation Technology Corporation, Wuxi 214000, China
XIAO Ming, GONG Yefei, WANG Hongding, LU Mingli, GAO Hua. Defect detection of light guide plate based on improved YOLOv5 networks[J]. Optoelectronics Letters,2024,20(9):560-567
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