.Configuration resonance in scattering scanning near-field optical microscopy[J].Optoelectronics Letters,2007,3(4):289-293 Configuration resonance in scattering scanning near-field optical microscopy WUCai-zhang MAOXiao-bo XUZhen-fang YE Hu-nian [1]SchoolofElectricalEngineering,HenanUniversityofTechnology,Zhengzhou450052,China [2]SchoolofElectricalEngineering,ZhengzhouUniversity,Zhengzhou450002,China [3]DepartmentofInstrumentation,HuazhongUniversityofScienceandTechnology,Wuhan430074,China Abstract:       A theoretical model is proposed in order to study the configuration resonance in s-SNOM. The electromagnetic coupling between the sample and the probe tip is described with the quasi-electrostatic field theory. This method permits us to analyze the configurational resonance evoked by the interaction between the probe tip and the sample in s-SNOM intuitively.The resonant conditions for a certain system are presented in an explicit form. On the condition of considering the actual size of the sample dipoles and the probe dipole, we discuss the possibility of realizing the configurational resonance for various material samples. The numerical results indicate that the polarizability of the dielectric probe tip is too small to arouse this resonance, whereas, with the surface plasmon resonance emerging on the metallic nanoparticles, the enhanced polarizability of the metallic probe tip ensures the requirements of fulfilling the resonance. Hits: 3569 Download times: 189 View Full Text    Download reader