.Traceable long range scanning tunneling microscopy[J].Optoelectronics Letters,2008,4(1):49-50
Traceable long range scanning tunneling microscopy
A. Weckenmann(Chair Quality Management and Manufacturing Metrology, University of Erlangen-Nuremberg, Naegelsbachstr. 25, 91052.Erlangen, Germany)
; J. Hoffmann(Chair Quality Management and Manufacturing Metrology, University of Erlangen-Nuremberg, Naegelsbachstr. 25, 91052.Erlangen, Germany)
;
Abstract:
      Dimensionally correct and directly traceable measurement is not feasible with conventional scanning tunneling microscopy (STMs) due to severe hysteresis and non-linearity of the commonly applied piezo tube scanners and the very short range.By integrating a custom made probing system based on tunneling current measurement into a commercially available and laser-interferometrically position controlled positioning system, an STM with a principal measuring range of 25 mm×25 mm×5 mm and traceable position measurement has been set-up and tested.
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