LI Jun-wei,WANG Zu-jun,SHI Cheng-ying,XUE Yuan-yuan,NING Hao,XU Rui.Evaluating electron induced degradation of triple-junction solar cell by numerical simulation[J].Optoelectronics Letters,2021,17(5):276-282 Evaluating electron induced degradation of triple-junction solar cell by numerical simulation Author Name Affiliation LI Jun-wei  Xi’an Research Institute of High-Technology, Xi’an710025, China  WANG Zu-jun  Northwest Institute of Nuclear Technology, Xi’an710024, China  SHI Cheng-ying  Xi’an Research Institute of High-Technology, Xi’an710025, China  XUE Yuan-yuan  Northwest Institute of Nuclear Technology, Xi’an710024, China  NING Hao  School of Materials Science and Engineering, Xiangtan University, Xiangtan 411105, China  XU Rui  School of Materials Science and Engineering, Xiangtan University, Xiangtan 411105, China  Abstract:       In this paper, the degradation related parameters of GaInP/GaAs/Ge triple-junction solar cell induced by electron irradiation are carried out by numerical simulation. The degradation results of short-circuit current, open-circuit voltage, maximum power have been investigated, and the degradation mechanism is analyzed. Combining the degradation results, the degradation of normalized parameters versus displacement damage dose is obtained. The results show that the degradation increases with the increase of the electron fluence and electron irradiation energy. The degradation normalized related parameters versus displacement damage dose can be characterized by a special curve that is not affected by the type of irradiated particles. By calculating the annual displacement damage dose and the on-orbit operation time of special space orbit, the degradation of normalized parameters can be obtained with the fitting curve in the simulation. The study will provide an approach to estimate the radiation damage of triple-junction solar cell induced by space particle irradiation. Hits: 763 Download times: 0 View Full Text    Download reader