| XUE Qi,JI Wenzhao,MENG Hao,SUN Xiaohong,YE Huiying,YANG Xiaonan.Estimating the quality of stripe in structured light 3D measurement[J].Optoelectronics Letters,2022,(2):103-108 |
| Estimating the quality of stripe in structured light 3D measurement |
| Author Name | Affiliation | | XUE Qi | School of Information Engineering, Zhengzhou University, Zhengzhou 450001, China[*? This work has been supported by the National Natural Science Foundation of China Nos.61705198 and 61874099, the Certificate of Postdoctoral Research Grant in Henan Province No.001801008, the Henan Innovation Demonstration Project No.201111212300, and the Zhengzhou Major Science and Technology Innovation Project No.2019CXZX0037. | | JI Wenzhao | School of Information Engineering, Zhengzhou University, Zhengzhou 450001, China[*? This work has been supported by the National Natural Science Foundation of China Nos.61705198 and 61874099, the Certificate of Postdoctoral Research Grant in Henan Province No.001801008, the Henan Innovation Demonstration Project No.201111212300, and the Zhengzhou Major Science and Technology Innovation Project No.2019CXZX0037. | | MENG Hao | School of Information Engineering, Zhengzhou University, Zhengzhou 450001, China[*? This work has been supported by the National Natural Science Foundation of China Nos.61705198 and 61874099, the Certificate of Postdoctoral Research Grant in Henan Province No.001801008, the Henan Innovation Demonstration Project No.201111212300, and the Zhengzhou Major Science and Technology Innovation Project No.2019CXZX0037. | | SUN Xiaohong | School of Information Engineering, Zhengzhou University, Zhengzhou 450001, China[*? This work has been supported by the National Natural Science Foundation of China Nos.61705198 and 61874099, the Certificate of Postdoctoral Research Grant in Henan Province No.001801008, the Henan Innovation Demonstration Project No.201111212300, and the Zhengzhou Major Science and Technology Innovation Project No.2019CXZX0037. | | YE Huiying | School of Information Engineering, Zhengzhou University, Zhengzhou 450001, China[*? This work has been supported by the National Natural Science Foundation of China Nos.61705198 and 61874099, the Certificate of Postdoctoral Research Grant in Henan Province No.001801008, the Henan Innovation Demonstration Project No.201111212300, and the Zhengzhou Major Science and Technology Innovation Project No.2019CXZX0037. | | YANG Xiaonan | School of Information Engineering, Zhengzhou University, Zhengzhou 450001, China[*? This work has been supported by the National Natural Science Foundation of China Nos.61705198 and 61874099, the Certificate of Postdoctoral Research Grant in Henan Province No.001801008, the Henan Innovation Demonstration Project No.201111212300, and the Zhengzhou Major Science and Technology Innovation Project No.2019CXZX0037. |
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| Abstract: |
| lity of stripe image. In the method, two parameters, skewness coefficient of stripe gray distribution and the noise level, are used to estimate the quality of stripe. The simulation results show that the bigger the skewness coefficient is, the bigger the error of stripe locating results is. Meanwhile, the smaller the noise level is, the smaller the error of stripe locating results is. The method has been used to estimate the experimental image, and the same conclusion can be obtained. The method can be used for recognizing large error data automatically by the two parameters. |
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